MOSFET Common-Source Amplifier — Biasing & Small-Signal Analysis
MOSFET Common-Source Amplifier — Biasing & Small-Signal Analysis
The MOSFET is a voltage-controlled current source with zero gate current, making its bias analysis simpler than the BJT but its transconductance $g_m$ lower for the same drain current. The common-source (CS) configuration is the MOSFET analogue of the common-emitter amplifier and delivers voltage gain with high input impedance — ideal for sensor interfaces and low-noise front-ends.
1. NMOS I–V Characteristics & Bias Point
In saturation ($V_{DS} > V_{GS} - V_{TN}$), the NMOS drain current is:
$$I_D = \frac{k_n W}{2L}(V_{GS} - V_{TN})^2 = \frac{k_n'}{2}(V_{GS} - V_{TN})^2$$
where $V_{TN}$ is the threshold voltage (0.5–2 V) and $k_n' = \mu_n C_{ox} W/L$ is the process transconductance parameter. The overdrive voltage $V_{OV} = V_{GS} - V_{TN}$ sets the operating point: lower $V_{OV}$ gives lower noise; higher $V_{OV}$ gives higher $g_m$ for the same current.
2. Self-Bias (Source-Degeneration) Bias
With a single gate resistor $R_G$ from $V_{GG}$ (or voltage-divider $R_{G1}, R_{G2}$) and source resistor $R_S$:
$$V_{GS} = V_G - I_D R_S$$
Substituting into the drain-current equation gives a quadratic in $I_D$. The stable operating point satisfies both the load line $V_{GS} = V_G - I_D R_S$ and the transistor equation — solved graphically or algebraically.
3. MOSFET Small-Signal Parameters
Evaluated at the Q-point $(I_{DQ}, V_{GSQ})$:
$$g_m = \sqrt{2 k_n' I_{DQ}} = k_n' V_{OV} \qquad r_o = \frac{1}{\lambda I_{DQ}} \qquad g_{mb} = \eta g_m$$
where $\lambda$ (channel-length modulation) $\approx 0.01{-}0.1$ V$^{-1}$ and $\eta \approx 0.1{-}0.3$ accounts for body effect (in bulk CMOS). Note: $g_m \propto \sqrt{I_D}$ for MOSFET vs $g_m \propto I_C$ for BJT — the MOSFET is a weaker amplifier at moderate current.
4. CS Mid-Band Gain & Frequency Response
With $R_S$ bypassed and load $R_D \| R_L$:
$$A_v = -g_m (R_D \| R_L \| r_o)$$
The dominant high-frequency pole is the Miller-multiplied $C_{gd}$ (gate–drain capacitance, typically 1–5 fF per μm of gate width in modern CMOS, or 2–10 pF in discrete MOSFETs):
$$f_{p1} \approx \frac{1}{2\pi R_s'(C_{gs} + C_{gd}(1+g_m R_D'))}$$
where $R_s' = R_s \| R_{G1} \| R_{G2}$ and $R_D' = R_D \| r_o \| R_L$.
Worked Example — NMOS CS Amplifier Q-Point
$V_{DD} = 5$ V, $R_{G1} = 1$ M$\Omega$, $R_{G2} = 500$ k$\Omega$, $R_D = 2$ k$\Omega$, $R_S = 1$ k$\Omega$ (bypassed), $k_n' = 2$ mA/V², $V_{TN} = 1$ V.
$V_G = 5 \times 500/(1000+500) = 1.667$ V. With $R_S$ bypassed for AC (but included for DC bias): $V_{GS} = V_G - I_D R_S = 1.667 - I_D(1000)$. Substituting: $I_D = 10^{-3}(1.667 - 1000 I_D - 1)^2 = 10^{-3}(0.667 - 1000 I_D)^2$. Let $x = I_D$ mA: $x = (0.667-x)^2$. $x = 0.445-1.334x+x^2$. $x^2 - 2.334x + 0.445 = 0$. $x = (2.334 \pm \sqrt{5.447-1.78})/2 = (2.334 \pm 1.914)/2$. Taking smaller root: $x = 0.210$ mA. $V_{GS} = 1.667 - 0.210 = 1.457$ V, $V_{OV} = 0.457$ V. $g_m = 2\times 10^{-3}\times 0.457 = 0.914$ mA/V. $A_v = -0.914 \times 2 = -1.83$ V/V (with $r_o \to \infty$). ✓
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